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statistical analysis of process variations in RF/ mm-wave circuits with on-the-fly passive macro-modeling



  ID Publisher : 0000008902
  Nama Jurnal : IEEE Transactions on Microwave Theory and Techniques
  Pengarang : jian yao zuochang ye and yan wang
  Subjek : milimeter-wave circuits passive macro-modeling process varitions RF circuits statistical analysis
  Edisi : 61 / 2 / Februari 2013


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