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Substrate-Induced Noise Model and Parameter Extraction for High-Frequency Noise Modeling of Sub-Micron MOSFETs



  ID Publisher : 0000008797
  Nama Jurnal : IEEE Transactions on Microwave Theory and Techniques
  Pengarang : Shih Ni Ong, Kiat Seng Yeo, Kok Wai Johnny Chew, and Lye Hock Kelvin Chan
  Subjek : Channel thermal noise, high-frequency noise modeling, gate-current noise, theemal noise
  Edisi : 62 / 9 / september 2014


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