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multifrequency excitation and support vector machine regressor for ECT defect characterization



  ID Publisher : 0000008767
  Nama Jurnal : IEEE Transactions On Insutrumentation and Measurement ( A Publication Of The IEEE Instrumentation and Measurement Society )
  Pengarang : andrea bernieri , giovanni betta luigi ferrigno marco laracca and stefano mastrostefano
  Subjek : giant magnetoresistance (GMR) sensor multifrequency eddy current testing (ECT) nondestructive testing (NDR) signal processing support vector machine
  Edisi : 63 / 5 / Mei 2014


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