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A comparison of uncertaintu evaluation methods for an-wafer s-parameter measurement



  ID Publisher : 0000008731
  Nama Jurnal : IEEE Transactions On Insutrumentation and Measurement ( A Publication Of The IEEE Instrumentation and Measurement Society )
  Pengarang : valeria teppati and andrea ferrero
  Subjek : measurement techniques measurement uncertainty milimeter wave devices milimeter wave technology
  Edisi : 63 / 4 / April 2014


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