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Smooth noonegative matrix factorization for defect detection using microwave nondestructive testing and evaluation



  ID Publisher : 0000008730
  Nama Jurnal : IEEE Transactions On Insutrumentation and Measurement ( A Publication Of The IEEE Instrumentation and Measurement Society )
  Pengarang : bin gao hong zhang wai lok woo gui yun tian libing bai and aijun yin
  Subjek : nondestructive testing and evaluation (NDT&E) nonnegative matrix factrorization openended waveguide smoothness source separation
  Edisi : 63 / 4 / April 2014


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