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Complex field fault modeling-based optimal frequency selection in linear analog circuit fault diagnosis



  ID Publisher : 0000008708
  Nama Jurnal : IEEE Transactions On Insutrumentation and Measurement ( A Publication Of The IEEE Instrumentation and Measurement Society )
  Pengarang : chenglin yang jing yang zhen liu and shulin tian
  Subjek : fault diagonosis fault dicrionary fault model optimization test frequencies selection
  Edisi : 63 / 4 / April 2014


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