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Characterization of intermodulation and memory effects using offeset multisine excitation



  ID Publisher : 0000008304
  Nama Jurnal : IEEE Transactions on Microwave Theory and Techniques
  Pengarang : Saeed farsi , paul draxler , hamed gheidi , bart K.J.C Nauwelaers , peter asbeck and dominique schreurs
  Subjek : Behavioral model, in-band distortion , memory effects , multitone excitation
  Edisi : 62 / 3 / maret 2014


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