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E-JOURNAL

On-Wafer Noise Measurment at 300 GHz Using UTC-PD as Noise Source



  ID Publisher : 0000007129
  Nama Jurnal : IEEE Microwave And Wireless Components Letters ( A Publication Of The IEEE Microwave Theory And Techniques Society )
  Pengarang : Ho-Jin Song, and Makoto Yaita
  Subjek : Noise figure (NF), on-wafer noise measurment, terahertz (THz) amplifier MMICC, uni-traveling-carrier photodiode (UTC-PD), Y-factor measurment.
  Edisi : 24 / 8 / Agustus 2014


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