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Circle Equation-Based Fault Modeling Method for Linear Analog Circuits



  ID Publisher : 0000007018
  Nama Jurnal : IEEE Transactions On Insutrumentation and Measurement ( A Publication Of The IEEE Instrumentation and Measurement Society )
  Pengarang : Shulin Tian, Chenglin Yang, Fang Chen, and Zhen Liu
  Subjek : Analog circuit, circle equation, faults diagnosis, fault location, fault modeling.
  Edisi : 63 / 9 / September 2014


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