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Metric of the Application Environment Impact to the Passive UHF RFID System



  ID Publisher : 0000006994
  Nama Jurnal : IEEE Transactions On Insutrumentation and Measurement ( A Publication Of The IEEE Instrumentation and Measurement Society )
  Pengarang : Bing Li, Yigang He, Lei Zuo, and Ying Long
  Subjek : Analytic hierarchy process (AHP), application environment impact, fuzzy comprehensive evaluation (FCE), metric, radio frequency identification (RFID).
  Edisi : 63 / 10 / Oktober 2014


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