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Simple, Broadband MAterial, Characterization Using Dual-Ridged Waveguideto Rectangular Waveguide Transitions



  ID Publisher : 0000006947
  Nama Jurnal : IEEE Transactions On Electromagnetic Compatibility ( A Publication Of The IEEE Electromagnetic Compatibility Society )
  Pengarang : Milo W. Hyde IV, and Michael J. Havrilla
  Subjek : Measurement uncertainty, microwave measurements, permeability measurement, permittivity measurement, uncertainty, waveguides.
  Edisi : 56 / 1 / February 2014


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