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Experimental Investigation onto the Effects of Electrical Stress on Electromagnetig Emission from Integratde Circuits



  ID Publisher : 0000006918
  Nama Jurnal : IEEE Transactions On Electromagnetic Compatibility ( A Publication Of The IEEE Electromagnetic Compatibility Society )
  Pengarang : Alexandre Boyer, Sonia Ben Dhia, Binghong Li, Nestor Berbel, and Raul Fernandez-Garcia
  Subjek : Aging effects, electromagnetic emission, integrated circuits, semiconductor devie reliability.
  Edisi : 56 / 1 / February 2014


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