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Thermal Study of the GaN High-Frequency Noise in GaN HEMTs



  ID Publisher : 0000004753
  Nama Jurnal : IEEE Transactions on Microwave Theory and Techniques
  Pengarang : Mattias Thorsell, Kristoffer Andersson, Martin Fagerlind, Per-Ake Nilsson, and Niklas Rorsman
  Subjek : Gallium nitride (GaN), modeling, noise, temperature measurement, thermal resistance
  Edisi : 57 / 1 / January 2009


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