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Scalable Small-Signal and Noise Modeling for deep-Submicrometer MOSFETs



  ID Publisher : 0000004616
  Nama Jurnal : IEEE Transactions on Microwave Theory and Techniques
  Pengarang : Jianjun Gao, and Andreas Werthof.
  Subjek : Equivalent circuits, noise modeling, parameter extraction,MOSFET,scalable model, semiconductor device modeling, small-signal modeling.
  Edisi : 57 / 4 / April 2009


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