IDDQ Testing of Low Voltage CMOS Operational Transconductance Amplifier
ID Publisher
: 0000042685
Nama Jurnal
: International Journal of Electrical and Computer Engineering (IJECE)
Pengarang
: Maninder Kaur, Jasdeep Kaur
Subjek
: bridging faults; build in current sensor (BICS) open faults; circuit under test (CUT), fault injection transistor (FIT) IDDQ testing; operational transconductance amplifier (OTA)
GANTI PASSWORD
