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Black Box Model based Self Healing Solution for Stuck at Faults in Digital Circuits



  ID Publisher : 0000042289
  Nama Jurnal : International Journal of Electrical and Computer Engineering (IJECE)
  Pengarang : S. Meyyappan, V. Alamelumangai
  Subjek : Black box model, Fault tolerance, Redundancy, Self healing, Stuck at faults
  Edisi : 7 / 5 / Oktober 2017


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