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Measurements and Stochastic FEA with Application in Thermomechanical Characterization of Electronic Packages



  ID Publisher : 0000021734
  Nama Jurnal : Journal of Engineering and Technological Sciences
  Pengarang : Omar Bendaou, Othmane Bendaou, Fran?ois Bourzeix, Mohamed Agouzoul, Abdelkhalak El Hami
  Subjek : BGA, FEA, microscope, shadow moire, stochastic analysis, warpage
  Edisi : 48 / 6 / Desember 2016


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