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E-JOURNAL

Survey on Mutation-based Test Data Generation



  ID Publisher : 0000020855
  Nama Jurnal : International Journal of Electrical and Computer Engineering (IJECE)
  Pengarang : Hanh Le Thi My, Binh Nguyen Thanh, Tung Khuat Thanh
  Subjek : Constraint based testing; Dynamic symbolic execution; Mutation testing; Search-based test data generation; Test data generation
  Edisi : 5 / 5 / Oktober 2015


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