Untitled HOME GANTI PASSWORD LOGOUT




Selamat Datang
SELAMAT DATANG DI PERPUSTAKAAN ONLINE

E-JOURNAL

A Survey of Fault-Injection Methodologies for Soft Error Rate Modeling in Systems-on-Chips



  ID Publisher : 0000018001
  Nama Jurnal : Bulletin of Electrical Engineering and Informatics (BEEI)
  Pengarang : Yeong Seob Jeong, Seong Mo Lee, Seung Eun Lee
  Subjek : system-on-chips, resilient design, fault injection, soft error, fault analysis
  Edisi : 5 / 2 / Juni 2016


Download File...

  Isi_Abstraksi_645249566956.pdf
  [   bytes ]


Kembali


Untitled
          
LINK FAKULTAS
MENU MAHASISWA