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E-JOURNAL

Leakage Immune 9T-SRAM Cell in Sub-threshold Region



  ID Publisher : 0000017993
  Nama Jurnal : Bulletin of Electrical Engineering and Informatics (BEEI)
  Pengarang : Priya Gupta, Anu Gupta, Abhijit Asati
  Subjek : Low power SRAM; Process variations; Sub-threshold SRAM; Static noise margin; Stability
  Edisi : 5 / 1 / Maret 2016


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