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Test Generation Algorithm Based on SVM with compressing Sample Space Methods



  ID Publisher : 0000013618
  Nama Jurnal : Jurnal TELKOMNIKA (Telekomunikasi Komputasi Elektronika Kendali)
  Pengarang : Ting Long, Jiang Shiqi, Hang Luo
  Subjek : Test Generation, SVM (Support Vector Machine), k-nearest Neighbors, Maximal Difference
  Edisi : 13 / 2 / Juni 2015


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