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E-JOURNAL

A Comprehensive Solution to Automated Inspection Device Selection Problems using ELECTRE Methods



  ID Publisher : 0000011681
  Nama Jurnal : International Journal of Technology
  Pengarang : Prasenjit Chatterjee, Suprakash Mondal, Shankar Chakraborty
  Subjek : Automated inspection device selection; Comparative analysis; ELECTRE II, IS, III, IV, TRI; MCDM
  Edisi : 5 / 2 / Juli 2014


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