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A Precision On-Chip Measurement Technique for Dielectric Absorption of an Integrated Capacitor



  ID Publisher : 0000011585
  Nama Jurnal : IEEE Transactions On Insutrumentation and Measurement ( A Publication Of The IEEE Instrumentation and Measurement Society )
  Pengarang : Young- Cheon Kwon,and Oh-Kyong Kwon
  Subjek : (DA),measurement accuracy,metal-isulator-metal (MIM) capacitor,off-leakage current cancelation,short-term repeatability,standard deviation of DA.
  Edisi : 63 / 6 / Juni 2014


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